Absolute calibration of a streaked optical pyrometer at nanosecond time scale with a luminescent concentrator.


Journal

The Review of scientific instruments
ISSN: 1089-7623
Titre abrégé: Rev Sci Instrum
Pays: United States
ID NLM: 0405571

Informations de publication

Date de publication:
01 Aug 2023
Historique:
received: 06 02 2023
accepted: 21 07 2023
medline: 9 12 2023
pubmed: 9 12 2023
entrez: 8 12 2023
Statut: ppublish

Résumé

The Streaked Optical Pyrometer (SOP) is a visible diagnostic widely used to study the warm dense matter regime at high energy laser facilities, gas guns, or ion accelerators. It is usually coupled with a Velocity Interferometer System for Any Reflector (VISAR) diagnostic for simultaneous shock wave velocity, reflectivity, and temperature measurements to study the Equation of State (EOS) of materials. While VISAR is a well-mastered technology that provides velocity measurements with low relative uncertainties (close to percent), SOP diagnostics still suffer from high imprecision. In this article, we present a new calibration method in order to obtain absolute temperature measurements with reduced uncertainties. This approach is based on a novel light source: a Ce:YAG luminescent concentrator pumped by LEDs. This device produces enough optical power for calibration at the nanosecond sweep duration of the streak camera. As a demonstration, it has first been installed at the LULI facility and tested on quartz samples shocked at temperatures above 4000 K.

Identifiants

pubmed: 38065135
pii: 2906243
doi: 10.1063/5.0145506
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Informations de copyright

© 2023 Author(s). Published under an exclusive license by AIP Publishing.

Auteurs

M Nourry-Martin (M)

CEA, DAM, DIF, F-91297 Arpajon, France.
Université Paris-Saclay, Institut d'Optique Graduate School, CNRS, Laboratoire Charles Fabry, 91127 Palaiseau, France.

A Denoeud (A)

CEA, DAM, DIF, F-91297 Arpajon, France.

C Chollet (C)

CEA, DAM, DIF, F-91297 Arpajon, France.

M Bonneau (M)

CEA, DAM, DIF, F-91297 Arpajon, France.

T Vinci (T)

LULI, CNRS, CEA, Sorbonne Université, Ecole Polytechnique-Institut Polytechnique de Paris, F-91128 Palaiseau, France.

A Ravasio (A)

LULI, CNRS, CEA, Sorbonne Université, Ecole Polytechnique-Institut Polytechnique de Paris, F-91128 Palaiseau, France.

S Brygoo (S)

CEA, DAM, DIF, F-91297 Arpajon, France.

S Darbon (S)

CEA, DAM, DIF, F-91297 Arpajon, France.

F Balembois (F)

Université Paris-Saclay, Institut d'Optique Graduate School, CNRS, Laboratoire Charles Fabry, 91127 Palaiseau, France.

Classifications MeSH