Photon-shot-noise-limited transient absorption soft X-ray spectroscopy at the European XFEL.

European XFEL transient absorption soft X-ray spectroscopy

Journal

Journal of synchrotron radiation
ISSN: 1600-5775
Titre abrégé: J Synchrotron Radiat
Pays: United States
ID NLM: 9888878

Informations de publication

Date de publication:
01 Mar 2023
Historique:
received: 08 11 2022
accepted: 24 01 2023
entrez: 9 3 2023
pubmed: 10 3 2023
medline: 10 3 2023
Statut: ppublish

Résumé

Femtosecond transient soft X-ray absorption spectroscopy (XAS) is a very promising technique that can be employed at X-ray free-electron lasers (FELs) to investigate out-of-equilibrium dynamics for material and energy research. Here, a dedicated setup for soft X-rays available at the Spectroscopy and Coherent Scattering (SCS) instrument at the European X-ray Free-Electron Laser (European XFEL) is presented. It consists of a beam-splitting off-axis zone plate (BOZ) used in transmission to create three copies of the incoming beam, which are used to measure the transmitted intensity through the excited and unexcited sample, as well as to monitor the incoming intensity. Since these three intensity signals are detected shot by shot and simultaneously, this setup allows normalized shot-by-shot analysis of the transmission. For photon detection, an imaging detector capable of recording up to 800 images at 4.5 MHz frame rate during the FEL burst is employed, and allows a photon-shot-noise-limited sensitivity to be approached. The setup and its capabilities are reviewed as well as the online and offline analysis tools provided to users.

Identifiants

pubmed: 36891842
pii: S1600577523000619
doi: 10.1107/S1600577523000619
pmc: PMC10000791
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

284-300

Subventions

Organisme : Deutsche Forschungsgemeinschaft
ID : SFB 1242

Informations de copyright

open access.

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Auteurs

Loïc Le Guyader (L)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Andrea Eschenlohr (A)

Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany.

Martin Beye (M)

Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany.

William Schlotter (W)

Linear Coherent Light Source, SLAC National Accelerator Lab, 2575 Sand Hill Rd, Menlo Park, CA 94025, USA.

Florian Döring (F)

Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.

Cammille Carinan (C)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

David Hickin (D)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Naman Agarwal (N)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Christine Boeglin (C)

Université de Strasbourg, CNRS, Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504, F-67000 Strasbourg, France.

Uwe Bovensiepen (U)

Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany.

Jens Buck (J)

Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany.

Robert Carley (R)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Andrea Castoldi (A)

Politecnico di Milano, Dip. Elettronica, Informazione e Bioingegneria and INFN, Sezione di Milano, Milano, Italy.

Alessandro D'Elia (A)

IOM-CNR, Laboratorio Nazionale TASC, Basovizza SS-14, km 163.5, 34012 Trieste, Italy.

Jan Torben Delitz (JT)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Wajid Ehsan (W)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Robin Engel (R)

Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany.

Florian Erdinger (F)

Institute for Computer Engineering, University of Heidelberg, Mannheim, Germany.

Hans Fangohr (H)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Peter Fischer (P)

Institute for Computer Engineering, University of Heidelberg, Mannheim, Germany.

Carlo Fiorini (C)

Politecnico di Milano, Dip. Elettronica, Informazione e Bioingegneria and INFN, Sezione di Milano, Milano, Italy.

Alexander Föhlisch (A)

Institute for Methods and Instrumentation for Synchrotron Radiation Research (PS-ISRR), Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (HZB), Albert-Einstein Straße 15, 12489 Berlin, Germany.

Luca Gelisio (L)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Michael Gensch (M)

Institute of Optical Sensor Systems, DLR (German Aerospace Center), Rutherfordstrasse 2, 12489 Berlin, Germany.

Natalia Gerasimova (N)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Rafael Gort (R)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Karsten Hansen (K)

Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany.

Steffen Hauf (S)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Manuel Izquierdo (M)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Emmanuelle Jal (E)

Sorbonne Université, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement, LCPMR, 75005 Paris, France.

Ebad Kamil (E)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Suren Karabekyan (S)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Thomas Kluyver (T)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Tim Laarmann (T)

Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany.

Tobias Lojewski (T)

Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany.

David Lomidze (D)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Stefano Maffessanti (S)

Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany.

Talgat Mamyrbayev (T)

Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.

Augusto Marcelli (A)

INFN - Laboratori Nazionali di Frascati, via Enrico Fermi 54, 00044 Frascati, Italy.

Laurent Mercadier (L)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Giuseppe Mercurio (G)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Piter S Miedema (PS)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Katharina Ollefs (K)

Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany.

Kai Rossnagel (K)

Institute of Experimental and Applied Physics, Kiel University, 24098 Kiel, Germany.

Benedikt Rösner (B)

Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.

Nico Rothenbach (N)

Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany.

Andrey Samartsev (A)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Justine Schlappa (J)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Kiana Setoodehnia (K)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Gheorghe Sorin Chiuzbaian (G)

Sorbonne Université, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement, LCPMR, 75005 Paris, France.

Lea Spieker (L)

Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany.

Christian Stamm (C)

Department of Materials, ETH Zürich, 8093 Zürich, Switzerland.

Francesco Stellato (F)

Physics Department, University of Rome Tor Vergata and INFN-Sezione di Roma Tor Vergata, Via della Ricerca Scientifica 1, 00133 Roma, Italy.

Simone Techert (S)

Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany.

Martin Teichmann (M)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Monica Turcato (M)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Benjamin Van Kuiken (B)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Heiko Wende (H)

Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany.

Alexander Yaroslavtsev (A)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Jun Zhu (J)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Serguei Molodtsov (S)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Christian David (C)

Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.

Matteo Porro (M)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Andreas Scherz (A)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Classifications MeSH