Adlayer formation on C-plane (0001) and R-plane
adsorption
aluminum oxide
pseudomorphic
scanning transmission electron microscopy
Journal
Journal of the American Ceramic Society. American Ceramic Society
ISSN: 0002-7820
Titre abrégé: J Am Ceram Soc
Pays: United States
ID NLM: 101511021
Informations de publication
Date de publication:
Feb 2023
Feb 2023
Historique:
pmc-release:
01
02
2024
entrez:
10
2
2023
pubmed:
11
2
2023
medline:
11
2
2023
Statut:
ppublish
Résumé
Adlayers on C-plane (0001) and R-plane
Identifiants
pubmed: 36761689
doi: 10.1111/jace.18814
pmc: PMC9903351
mid: NIHMS1856735
doi:
Types de publication
Journal Article
Langues
eng
Pagination
1490-1499Subventions
Organisme : Intramural NIST DOC
ID : 9999-NIST
Pays : United States
Déclaration de conflit d'intérêts
Conflicts of Interests The authors declare no competing financial interests.
Références
Langmuir. 2005 Aug 2;21(16):7358-65
pubmed: 16042466
Adv Struct Chem Imaging. 2017;3(1):9
pubmed: 28251043
Chem Rev. 1998 Jun 18;98(4):1479-1514
pubmed: 11848940
Nat Methods. 2012 Jun 28;9(7):676-82
pubmed: 22743772
Nat Mater. 2004 Mar;3(3):143-6
pubmed: 14991014
Ultramicroscopy. 2018 Oct;193:1-11
pubmed: 29906518
Phys Rev Lett. 2013 Oct 11;111(15):156101
pubmed: 24160614
IEEE Trans Image Process. 1998;7(1):27-41
pubmed: 18267377
Nano Lett. 2016 Jan 13;16(1):132-7
pubmed: 26652061
Nano Lett. 2017 Oct 11;17(10):6140-6145
pubmed: 28902517
Nat Methods. 2012 Jul;9(7):671-5
pubmed: 22930834
Science. 2006 Jan 13;311(5758):212-5
pubmed: 16410521