Self-Assembly of Nanovoids in Si Microcrystals Epitaxially Grown on Deeply Patterned Substrates.


Journal

Crystal growth & design
ISSN: 1528-7483
Titre abrégé: Cryst Growth Des
Pays: United States
ID NLM: 101261892

Informations de publication

Date de publication:
06 May 2020
Historique:
received: 03 10 2019
revised: 08 04 2020
entrez: 8 4 2021
pubmed: 9 4 2021
medline: 9 4 2021
Statut: ppublish

Résumé

We present an experimental and theoretical analysis of the formation of nanovoids within Si microcrystals epitaxially grown on Si patterned substrates. The growth conditions leading to the nucleation of nanovoids have been highlighted, and the roles played by the deposition rate, substrate temperature, and substrate pattern geometry are identified. By combining various scanning and transmission electron microscopy techniques, it has been possible to link the appearance pits of a few hundred nanometer width at the microcrystal surface with the formation of nanovoids within the crystal volume. A phase-field model, including surface diffusion and the flux of incoming material with shadowing effects, reproduces the qualitative features of the nanovoid formation thereby opening new perspectives for the bottom-up fabrication of 3D semiconductors microstructures.

Identifiants

pubmed: 33828439
doi: 10.1021/acs.cgd.9b01312
pmc: PMC8016367
doi:

Types de publication

Journal Article

Langues

eng

Pagination

2914-2920

Déclaration de conflit d'intérêts

The authors declare no competing financial interest.

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Auteurs

Andrea Barzaghi (A)

L-NESS, Dipartimento di Fisica, Politecnico di Milano, Via Anzani 42, 22100 Como, Italy.

Saleh Firoozabadi (S)

Materials Science Center and Faculty of Physics, Philipps-Universität Marburg, Hans-Meerweinstraße 6, 35032 Marburg, Germany.

Marco Salvalaglio (M)

Institute of Scientific Computing, Technische Universität Dresden, 01062 Dresden, Germany.
Dresden Center for Computational Materials Science, Technische Universität Dresden, 01062 Dresden, Germany.

Roberto Bergamaschini (R)

L-NESS and Dipartimento di Scienza dei Materiali, Università di Milano-Bicocca, Via R. Cozzi 55, I-20125 Milano, Italy.

Andrea Ballabio (A)

L-NESS, Dipartimento di Fisica, Politecnico di Milano, Via Anzani 42, 22100 Como, Italy.

Andreas Beyer (A)

Materials Science Center and Faculty of Physics, Philipps-Universität Marburg, Hans-Meerweinstraße 6, 35032 Marburg, Germany.

Marco Albani (M)

L-NESS and Dipartimento di Scienza dei Materiali, Università di Milano-Bicocca, Via R. Cozzi 55, I-20125 Milano, Italy.

Joao Valente (J)

James Watt School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, Glasgow G12 8LT, United Kingdom.

Axel Voigt (A)

Institute of Scientific Computing, Technische Universität Dresden, 01062 Dresden, Germany.
Dresden Center for Computational Materials Science, Technische Universität Dresden, 01062 Dresden, Germany.

Douglas J Paul (DJ)

James Watt School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, Glasgow G12 8LT, United Kingdom.

Leo Miglio (L)

L-NESS and Dipartimento di Scienza dei Materiali, Università di Milano-Bicocca, Via R. Cozzi 55, I-20125 Milano, Italy.

Francesco Montalenti (F)

L-NESS and Dipartimento di Scienza dei Materiali, Università di Milano-Bicocca, Via R. Cozzi 55, I-20125 Milano, Italy.

Kerstin Volz (K)

Materials Science Center and Faculty of Physics, Philipps-Universität Marburg, Hans-Meerweinstraße 6, 35032 Marburg, Germany.

Giovanni Isella (G)

L-NESS, Dipartimento di Fisica, Politecnico di Milano, Via Anzani 42, 22100 Como, Italy.

Classifications MeSH