Automatic 3D image registration for nano-resolution chemical mapping using synchrotron spectro-tomography.
3D image registration
X-ray spectro-tomography
chemical heterogeneity
transmission X-ray microscopy
Journal
Journal of synchrotron radiation
ISSN: 1600-5775
Titre abrégé: J Synchrotron Radiat
Pays: United States
ID NLM: 9888878
Informations de publication
Date de publication:
01 Jan 2021
01 Jan 2021
Historique:
received:
20
06
2020
accepted:
06
11
2020
entrez:
5
1
2021
pubmed:
6
1
2021
medline:
6
1
2021
Statut:
ppublish
Résumé
Nano-resolution synchrotron X-ray spectro-tomography has been demonstrated as a powerful tool for probing the three-dimensional (3D) structural and chemical heterogeneity of a sample. By reconstructing a number of tomographic data sets recorded at different X-ray energy levels, the energy-dependent intensity variation in every given voxel fingerprints the corresponding local chemistry. The resolution and accuracy of this method, however, could be jeopardized by non-ideal experimental conditions, e.g. instability in the hardware system and/or in the sample itself. Herein is presented one such case, in which unanticipated sample deformation severely degrades the data quality. To address this issue, an automatic 3D image registration method is implemented to evaluate and correct this effect. The method allows the redox heterogeneity in partially delithiated Li
Identifiants
pubmed: 33399578
pii: S1600577520014691
doi: 10.1107/S1600577520014691
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
278-282Subventions
Organisme : National Key Research and Development Program of China
ID : 2016YFA0400900
Organisme : U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences
ID : DE-AC02-76SF00515