High-Mobility Epitaxial Graphene on Ge/Si(100) Substrates.

Ge epilayers LEED STM Si(100) charge carrier mobilities epitaxial graphene photoemission surface transport

Journal

ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991

Informations de publication

Date de publication:
23 Sep 2020
Historique:
pubmed: 1 9 2020
medline: 1 9 2020
entrez: 1 9 2020
Statut: ppublish

Résumé

Graphene was shown to reveal intriguing properties of its relativistic two-dimensional electron gas; however, its implementation to microelectronic applications is missing to date. In this work, we present a comprehensive study of epitaxial graphene on technologically relevant and in a standard CMOS process achievable Ge(100) epilayers grown on Si(100) substrates. Crystalline graphene monolayer structures were grown by means of chemical vapor deposition (CVD). Using angle-resolved photoemission spectroscopy and in situ surface transport measurements, we demonstrate their metallic character both in momentum and real space. Despite numerous crystalline imperfections, e.g., grain boundaries and strong corrugation, as compared to epitaxial graphene on SiC(0001), charge carrier mobilities of 1 × 10

Identifiants

pubmed: 32865383
doi: 10.1021/acsami.0c10725
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

43065-43072

Auteurs

J Aprojanz (J)

Institut für Physik, Technische Universität Chemnitz, Chemnitz 09126, Germany.

Ph Rosenzweig (P)

Max-Planck-Institut für Festkörperforschung, Heisenbergstraße 1, Stuttgart 70569, Germany.

T T Nhung Nguyen (TTN)

Institut für Physik, Technische Universität Chemnitz, Chemnitz 09126, Germany.

H Karakachian (H)

Max-Planck-Institut für Festkörperforschung, Heisenbergstraße 1, Stuttgart 70569, Germany.

K Küster (K)

Max-Planck-Institut für Festkörperforschung, Heisenbergstraße 1, Stuttgart 70569, Germany.

U Starke (U)

Max-Planck-Institut für Festkörperforschung, Heisenbergstraße 1, Stuttgart 70569, Germany.

M Lukosius (M)

Leibniz-Institut für innovative Mikroelektronik, Im Technologiepark 25, Frankfurt (Oder) 15236, Germany.

G Lippert (G)

Leibniz-Institut für innovative Mikroelektronik, Im Technologiepark 25, Frankfurt (Oder) 15236, Germany.

A Sinterhauf (A)

IV. Physikalisches Institut, Georg-August-Universität Göttingen, 37077 Göttingen, Germany.

M Wenderoth (M)

IV. Physikalisches Institut, Georg-August-Universität Göttingen, 37077 Göttingen, Germany.

A A Zakharov (AA)

MAX IV Laboratory and Lund University, Lund 22100, Sweden.

C Tegenkamp (C)

Institut für Physik, Technische Universität Chemnitz, Chemnitz 09126, Germany.

Classifications MeSH