Boron-Doped Nanocrystalline Diamond-Carbon Nanospike Hybrid Electron Emission Source.

carbon nanospike field electron emission microplasma illumination nanocrystalline diamond one-step growth

Journal

ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991

Informations de publication

Date de publication:
26 Dec 2019
Historique:
pubmed: 4 12 2019
medline: 4 12 2019
entrez: 4 12 2019
Statut: ppublish

Résumé

Electron emission signifies an important mechanism facilitating the enlargement of devices that have modernized large parts of science and technology. Today, the search for innovative electron emission devices for imaging, sensing, electronics, and high-energy physics continues. Integrating two materials with dissimilar electronic properties into a hybrid material is an extremely sought-after synergistic approach, envisioning a superior field electron emission (FEE) material. An innovation is described regarding the fabrication of a nanostructured carbon hybrid, resulting from the one-step growth of boron-doped nanocrystalline diamond (BNCD) and carbon nanospikes (CNSs) by a microwave plasma-enhanced chemical vapor deposition technique. Spectroscopic and microscopic tools are used to investigate the morphological, bonding, and microstructural characteristics related to the growth mechanism of these hybrids. Utilizing the benefits of both the sharp edges of the CNSs and the high stability of BNCD, promising FEE performance with a lower turn-on field of 1.3 V/μm, a higher field enhancement factor of 6780, and a stable FEE current stability lasting for 780 min is obtained. The microplasma devices utilizing these hybrids as a cathode illustrate a superior plasma illumination behavior. Such hybrid carbon nanostructures, with superb electron emission characteristics, can encourage the enlargement of several electron emission device technologies.

Identifiants

pubmed: 31794182
doi: 10.1021/acsami.9b17942
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

48612-48623

Auteurs

Kamatchi Jothiramalingam Sankaran (KJ)

Institute for Materials Research (IMO) , Hasselt University , 3590 Diepenbeek , Belgium.
IMOMEC, IMEC vzw , 3590 Diepenbeek , Belgium.

Mateusz Ficek (M)

Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics , Gdansk University of Technology , 11/12 G. Narutowicza Street , 80-233 Gdansk , Poland.

Kalpataru Panda (K)

Center for Nanomaterials and Chemical Reactions , Institute for Basic Science (IBS) , 34141 Daejeon , Korea.
Department of Chemistry , Korea Advanced Institute of Science and Technology (KAIST) , 34141 Daejeon , Korea.

Chien-Jui Yeh (CJ)

Department of Engineering and System Science , National Tsing Hua University , Hsinchu , 30013 Taiwan , Republic of China.

Miroslaw Sawczak (M)

Center for Plasma and Laser Engineering, The Szewalski Institute of Fluid Flow Machinery , Polish Academy of Sciences , Fiszera 14 , 80-231 Gdansk , Poland.

Jacek Ryl (J)

Department of Electrochemistry, Corrosion and Materials Engineering, Faculty of Chemistry , Gdansk University of Technology , Narutowicza 11/12 , 80-233 Gdansk , Poland.

Keh-Chyang Leou (KC)

Department of Engineering and System Science , National Tsing Hua University , Hsinchu , 30013 Taiwan , Republic of China.

Jeong Young Park (JY)

Center for Nanomaterials and Chemical Reactions , Institute for Basic Science (IBS) , 34141 Daejeon , Korea.
Department of Chemistry , Korea Advanced Institute of Science and Technology (KAIST) , 34141 Daejeon , Korea.

I-Nan Lin (IN)

Department of Physics , Tamkang University , Tamsui , 251 Taiwan , Republic of China.

Robert Bogdanowicz (R)

Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics , Gdansk University of Technology , 11/12 G. Narutowicza Street , 80-233 Gdansk , Poland.

Ken Haenen (K)

Institute for Materials Research (IMO) , Hasselt University , 3590 Diepenbeek , Belgium.
IMOMEC, IMEC vzw , 3590 Diepenbeek , Belgium.

Classifications MeSH